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1

Initial Shipment Decisions for New Products at Zara

Gallien, Jérémie, Mersereau, Adam J., Garro, Andres, Mora, Alberte Dapena, Vidal, Martín Nóvoa

Journal:

Operations Research

Year:

2015

Language:

english

File:

PDF, 2.79 MB

english, 2015

2

Shape Retrieval of Non-rigid 3D Human Models

Pickup, D., Sun, X., Rosin, P. L., Martin, R. R., Cheng, Z., Lian, Z., Aono, M., Hamza, A. Ben, Bronstein, A., Bronstein, M., Bu, S., Castellani, U., Cheng, S., Garro, V., Giachetti, A., Godil, A., Is

Journal:

International Journal of Computer Vision

Year:

2016

Language:

english

File:

PDF, 5.65 MB

english, 2016

3

Process dependence of BTI reliability in advanced HK MG stacks

X. Garros, M. Casse, M. Rafik, C. Fenouillet-Béranger, G. Reimbold, F. Martin, C. Wiemer, F. Boulanger

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 1.59 MB

english, 2009

4

Investigation of hafnium-aluminate alloys in view of integration as interpoly dielectrics of future Flash memories

Gabriel Molas, Marc Bocquet, Julien Buckley, Helen Grampeix, Marc Gély, Jean-Philippe Colonna, Christophe Licitra, Névine Rochat, Thomas Veyront, Xavier Garros, François Martin, Pierre Brianceau, Vinc

Journal:

Solid-State Electronics

Year:

2007

Language:

english

File:

PDF, 497 KB

english, 2007

5

Impact of a HTO/Al2O3 bi-layer blocking oxide in nitride-trap non-volatile memories

M. Bocquet, G. Molas, L. Perniola, X. Garros, J. Buckley, M. Gély, J.P. Colonna, H. Grampeix, F. Martin, V. Vidal, A. Toffoli, S. Deleonibus, G. Ghibaudo, G. Pananakakis, B. De Salvo

Journal:

Solid-State Electronics

Year:

2009

Language:

english

File:

PDF, 782 KB

english, 2009

6

Initial and PBTI-induced traps and charges in Hf-based oxides/TiN stacks

G. Reimbold, J. Mitard, X. Garros, C. Leroux, G. Ghibaudo, F. Martin

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 816 KB

english, 2007

7

[IEEE ESSDERC 2003. 33rd European Solid-State Device Research - ESSDERC '03 - Estoril, Portugal (16-18 Sept. 2003)] Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710) - Towards a better EOT - mobility trade-off in high-k oxide/metal gate CMOS devices

Muller, M., Duguay, S., Guillaumot, B., Garros, X., Leroux, C., Tavel, B., Martin, F., Rivoire, M., Delille, D., Boeuf, F., Deleonibus, S., Skotnicki, T.

Year:

2003

Language:

english

File:

PDF, 312 KB

english, 2003

8

[IEEE 2016 IEEE International Symposium on Systems Engineering (ISSE) - Edinburgh, United Kingdom (2016.10.3-2016.10.5)] 2016 IEEE International Symposium on Systems Engineering (ISSE) - On formal cyber physical system properties modeling: A new temporal logic language and a Modelica-based solution

Garro, Alfredo, Tundis, Andrea, Bouskela, Daniel, Jardin, Audrey, Thuy, Nguyen, Otter, Martin, Buffoni, Lena, Fritzson, Peter, Sjolund, Martin, Schamai, Wladimir, Olsson, Hans

Year:

2016

Language:

english

File:

PDF, 988 KB

english, 2016

9

MOCVD fluorine free WSix metal gate electrode on high-k dielectric for NMOS technology

R. Gassilloud, F. Martin, C. Leroux, M. Hopstaken, X. Garros, M. Cassé, Gilles Reimbold, Thierry Billon, Daniel Bensahel

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 695 KB

english, 2009

10

Performance and reliability of advanced High-K/Metal gate stacks (Invited Paper)

X. Garros, M. Casse, G. Reimbold, M. Rafik, F. Martin, F. Andrieu, V. Cosnier, F. Boulanger

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 932 KB

english, 2009

11

SiON and SiO2/HfSiON gate oxides time dependent dielectric breakdown measurements at nanoscale in ultra high vacuum

P. Delcroix, S. Blonkowski, M. Kogelschatz, M. Rafik, O. Gourhant, D. JeanJean, R. Beneyton, D. Roy, X. Federspiel, F. Martin, X. Garros, H. Grampeix, R. Gassilloud

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 573 KB

english, 2011

12

Shiva A Multiarms Machine Tool

O. Garro, P. Martin, M. Veron

Journal:

CIRP Annals - Manufacturing Technology

Year:

1993

Language:

english

File:

PDF, 347 KB

english, 1993

13

Electrical and physico-chemical characterization of HfO2/SiO2 gate oxide stacks prepared by atomic layer deposition

J.-F. Damlencourt, O. Renault, D. Samour, A.-M. Papon, C. Leroux, F. Martin, S. Marthon, M.-N. Séméria, X. Garros

Journal:

Solid-State Electronics

Year:

2003

Language:

english

File:

PDF, 234 KB

english, 2003

14

Interallelic recombination is probably responsible for the occurrence of a new αs1-casein variant found in the goat species

Claudia Bevilacqua, Pasquale Ferranti, Giuseppina Garro, Cristina Veltri, Raffaella Lagonigro, Christine Leroux, Emilio Pietrolà, Francesco Addeo, Fabio Pilla, Lina Chianese, Patrice Martin

Journal:

Year:

2002

Language:

english

File:

PDF, 593 KB

english, 2002

15

In silico study of the inhibition of DNA polymerase by a novel catalpol derivative

Osvaldo A. Martin, Hugo A. Garro, Marcela B. Kurina Sanz, Carlos Rodolfo Pungitore, Carlos E. Tonn

Journal:

Journal of Molecular Modeling

Year:

2011

Language:

english

File:

PDF, 359 KB

english, 2011

16

[IEEE 2006 IEEE International Conference on Semiconductor Electronics - Kuala Lumpur, Malaysia (2006.10.29-2006.12.1)] 2006 IEEE International Conference on Semiconductor Electronics - Investigating the Performance of RF MEMS Switches

Su, Hieng Tiong, Llamas-Garro, Ignacio, Lancaster, Michael J., Prest, Martin, Park, Jae-Hyoung, Kim, Jung-Mu, Baek, Chang-Wook, Kim, Yong-Kweon

Year:

2006

Language:

english

File:

PDF, 2.01 MB

english, 2006

17

[IEEE 2011 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2011.04.25-2011.04.27)] Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications - UTBOX and ground plane combined with Al2O3 inserted in TiN gate for VT modulation in fully-depleted SOI CMOS transistors

Fenouillet-Beranger, C., Perreau, P., Casse, M., Garros, X., Leroux, C., Martin, F., Gassilloud, R., Bajolet, A., Tosti, L., Barnola, S., Andrieu, F., Weber, O., Beneyton, R., Perrot, C., de Buttet, C

Year:

2011

Language:

english

File:

PDF, 472 KB

english, 2011

18

Bloqueo auriculoventricular completo secundario a toxicidad cardíaca por cloroquina

A.M. Mata Martín, F.J. Martínez Marcos, C. Borrachero Garro, I. Martín Suárez

Journal:

Revista Clínica Española

Year:

2006

File:

PDF, 893 KB

2006

19

[IEEE Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. - Kyoto, Japan (June 14-16, 2005)] Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. - ΩFETs transistors with tin metal gate and HfO/sub 2/ down to 10nm

Jahan, C., Faynot, O., Casse, M., Ritzenthaler, R., Brevard, L., Tosti, L., Garros, X., Vizioz, C., Allain, F., Papon, A.M., Dansas, H., Martin, F., Vinet, M., Guillaumot, B., Toffoli, A., Giffard, B.

Year:

2005

Language:

english

File:

PDF, 413 KB

english, 2005

20

Towards new architectures of machine tools

GARRO, O., MARTIN, P.

Journal:

International Journal of Production Research

Year:

1993

Language:

english

File:

PDF, 381 KB

english, 1993

21

Culicoides biting midges, arboviruses and public health in Europe

Carpenter, Simon, Groschup, Martin H., Garros, Claire, Felippe-Bauer, Maria Luiza, Purse, Bethan V.

Journal:

Antiviral Research

Year:

2013

Language:

english

File:

PDF, 1.56 MB

english, 2013

22

Tumor de células de leydig. dos nuevos casos

Herrera Puerto, J., Herrera Flores, C., Pierna Manzano, J., Isusquiza Garro, I., Arranz Martín, A., Hoyos Fitto, C., GóMez Tejeda, L.M.

Journal:

Actas Urológicas Españolas (Spanish Edition)

Year:

2002

File:

PDF, 127 KB

2002

23

Pseudotumor peneano luético. presentación de un caso

Herrera Puerto, J., Herrera Flores, C., lópez Elzaurdia, C., Serrano Heranz, R., gonzález Morán, A., Pierna Manzano, J., Isusquiza Garro, I., martín López, R., Hoyos Fitto, C.

Journal:

Actas Urológicas Españolas (Spanish Edition)

Year:

2002

File:

PDF, 127 KB

2002

24

Colonización-infección por Pseudomonas aeruginosa en pacientes con bronquiectasias y EPOC. Aspectos clínicos microbiológicos y evolutivos

Garrós Garay, J., Ruiz de Gordejuela, E., García Cebrián, F., Martín Saco, G., Gallego, L., Pérez Escajadillo, J.

Journal:

Gaceta Médica de Bilbao

Year:

2002

File:

PDF, 70 KB

2002

25

Enfermedad pulmonar por Mycobacterium kansasii. Análisis de 39 casos

Garrós Garay, J., García Cebrián, F., Lorza Blasco, J.J., Ruiz De Gordejuela, E., Martín Saco, G.

Journal:

Archivos de Bronconeumología

Year:

2001

File:

PDF, 66 KB

2001

26

Gate-last integration on planar FDSOI for low-VTp and low-EOT MOSFETs

Morvan, S., Andrieu, F., Leroux, C., Garros, X., Cassé, M., Martin, F., Gassilloud, R., Morand, Y., Le Royer, C., Besson, P., Roure, M.-C., Euvrard, C., Rivoire, M., Seignard, A., Desvoivres, L., Barn

Journal:

Microelectronic Engineering

Year:

2013

Language:

english

File:

PDF, 816 KB

english, 2013

27

Epidemiology, antibiotic therapy and clinical outcomes of healthcare-associated pneumonia in critically ill patients: a Spanish cohort study

Vallés, Jordi, Martin-Loeches, Ignacio, Torres, Antoni, Diaz, Emili, Seijas, Iratxe, López, Maria José, Garro, Pau, Castillo, Carlos, Garnacho-Montero, Jose, Martin, María del Mar, Torre, Maria Victor

Journal:

Intensive Care Medicine

Year:

2014

Language:

english

File:

PDF, 274 KB

english, 2014

28

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Detrimental impact of technological processes on BTI reliability of advanced high-K/metal gate stacks

Garros, X., Casse, M., Fenouillet-Beranger, C., Reimbold, G., Martin, F., Gaumer, C., Wiemer, C., Perego, M., Boulanger, F.

Year:

2009

Language:

english

File:

PDF, 484 KB

english, 2009

29

[IEEE Technology (ICICDT) - Grenoble, France (2010.06.2-2010.06.4)] 2010 IEEE International Conference on Integrated Circuit Design and Technology - Reliability concerns in High-K/Metal gate technologies

Garros, X., Casse, M., Reimbold, G., Martin, F., Brunet, L., Andrieu, F., Boulanger, F.

Year:

2010

Language:

english

File:

PDF, 155 KB

english, 2010

30

[IEEE 2006 European Solid-State Device Research Conference - Montreux, Switzerland (2006.09.19-2006.09.21)] 2006 European Solid-State Device Research Conference - In-depth Investigation of HfAlO Layers as Interpoly Dielectrics of Future Flash Memories

Molas, G., Grampeix, H., Buckley, J., Bocquet, M., Garros, X., Martin, F., Colonna, J., Brianceau, P., Vidal, V., Gely, M., Salvo, B., Deleonibus, S., Bongiorno, C., Lombardo, S.

Year:

2006

Language:

english

File:

PDF, 950 KB

english, 2006

31

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Characterization and modeling of hysteresis phenomena in high K dielectrics

Leroux, C., Mitard, J., Ghibaud, G., Garros, X., Reimbold, G., Guillaumot, B., Martin, F.

Year:

2004

Language:

english

File:

PDF, 277 KB

english, 2004

32

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Interface states in HFO/sub 2/ stacks with metal gate: nature, passivation, generation

Garros, X., Reimbold, G., Duret, D., Leroux, C., Guillaumot, B., Louveau, O., Hobbs, C., Martin, F.

Year:

2005

Language:

english

File:

PDF, 977 KB

english, 2005

33

[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting - Work-function engineering in gate first technology for multi-VT dual-gate FDSOI CMOS on UTBOX

Weber, O., Andrieu, F., Mazurier, J., Casse, M., Garros, X., Leroux, C., Martin, F., Perreau, P., Fenouillet-Beranger, C., Barnola, S., Gassilloud, R., Arvet, C., Thomas, O., Noel, J-P., Rozeau, O., J

Year:

2010

Language:

english

File:

PDF, 2.35 MB

english, 2010

34

[IEEE 2008 Symposium on VLSI Technology - Honolulu, HI, USA (2008.06.17-2008.06.19)] 2008 Symposium on VLSI Technology - Guidelines to improve mobility performances and BTI reliability of advanced high-k/metal gate stacks

Garros, X., Casse, M., Reimbold, G., Martin, F., Leroux, C., Fanton, A., Renault, O., Cosnier, V., Boulanger, F.

Year:

2008

Language:

english

File:

PDF, 322 KB

english, 2008

35

Physically Abused Pregnant Women's Perceptions About the Quality of Their Relationships with Their Male Partners

Cloutier, Suzanne, Martin, Sandra L., Moracco, Kathryn E., Garro, Julian, Clark, Kathryn Andersen, Brody, Seth

Journal:

Year:

2002

Language:

english

File:

PDF, 108 KB

english, 2002

36

[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Large-Scale Time Characterization and Analysis of PBTI In HFO2/Metal Gate Stacks

Mitard, J., Garros, X., Nguyen, L.p., Leroux, C., Ghibaudo, G., Martin, F., Reimbold, G.

Year:

2006

Language:

english

File:

PDF, 931 KB

english, 2006

37

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Process damages in HfO/sub 2/TiN stacks: the key role of H/sup 0/ and H/sub 2/ anneals

Garros, X., Reimbold, G., Louveau, O., Holliger, P., Hobbs, C., Leroux, C., L. Pham Nguyen,, Martin, F., Boulanger, F.

Year:

2005

Language:

english

File:

PDF, 350 KB

english, 2005

38

[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Reliability assessment of ultra-thin HfO/sub 2/ oxides with TiN gate and polysilicon-n/sup +/ gate

Garros, X., Leroux, C., Reinibold, G., Mitard, J., Guillaumot, B., Martin, F., Autran, J.L.

Year:

2004

Language:

english

File:

PDF, 304 KB

english, 2004

39

[IEEE 2010 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2010.06.15-2010.06.17)] 2010 Symposium on VLSI Technology - New insight on VT stability of HK/MG stacks with scaling in 30nm FDSOI technology

Brunet, L., Garros, X., Casse, M., Weber, O., Andrieu, F., Fenouillet-Beranger, C., Perreau, P., Martin, F., Charbonnier, M., Lafond, D., Gaumer, C., Lhostis, S., Vidal, V., Brevard, L., Tosti, L., De

Year:

2010

Language:

english

File:

PDF, 609 KB

english, 2010

40

[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - High performance 40 nm nMOSFETs with HfO/sub 2/ gate dielectric and polysilicon damascene gate

Tavel, B., Garros, X., Skotnicki, T., Martin, F., Leroux, C., Bensahel, D., Semeria, M.N., Morand, Y., Damlencourt, J.F., Descombes, S., Leverd, F., Le-Friec, Y., Leduc, P., Rivoire, M., Jullian, S.,

Year:

2002

Language:

english

File:

PDF, 259 KB

english, 2002

41

Lattice dynamics of wurtzite and rocksalt AlN under high pressure: Effect of compression on the crystal anisotropy of wurtzite-type semiconductors

Manjón, Francisco Javier, Errandonea, Daniel, Romero, Aldo Humberto, Garro, Núria, Serrano, Jorge, Kuball, Martin

Journal:

Physical Review B

Year:

2008

Language:

english

File:

PDF, 862 KB

english, 2008

42

[IEEE ESSDERC 2008 - 38th European Solid-State Device Research Conference - Edinburgh, UK (2008.09.15-2008.09.19)] ESSDERC 2008 - 38th European Solid-State Device Research Conference - On the role of a HTO/Al2O3 bi-layer blocking oxide in nitride-trap non-volatile memories

Bocquet, M., Molas, G., Perniola, L., Garros, X., Buckley, J., Gely, M., Colonna, J. P., Grampeix, H., Martin, F., Vidal, V., Toffoli, A., De Salvo, B., Deleonibus, S., Pananakakis, G., Ghibaudo, G.

Year:

2008

Language:

english

File:

PDF, 285 KB

english, 2008

43

[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - 75 nm damascene metal gate and high-k integration for advanced CMOS devices

Guillaumot, B., Garros, X., Lime, F., Oshima, K., Tavel, B., Chroboczek, J.A., Masson, P., Truche, R., Papon, A.M., Martin, F., Damlencourt, J.F., Maitrejean, S., Rivoire, M., Leroux, C., Cristolovean

Year:

2002

Language:

english

File:

PDF, 232 KB

english, 2002

44

[IEEE 2003 8th International Symposium on Plasma- and Process-Induced Damage - Corbeil-Essonnes, France (24-25 April 2003)] 2003 8th International Symposium Plasma- and Process-Induced Damage. - Metal gate and high-k integration for advanced CMOS devices

Guillaumot, B., Garros, X., Lime, F., Oshima, K., Chroboczek, J.A., Masson, P., Truche, R., Papon, A.M., Martin, F., Damlencourt, J.F., Maitrejean, S., Rivoire, M., Leroux, C., Cristoloveanu, S., Ghib

Year:

2003

Language:

english

File:

PDF, 401 KB

english, 2003

45

Algebraic description for machine tool design

GARRO, O., MARTIN, P., MARTI, H.

Journal:

International Journal of Production Research

Year:

1992

Language:

english

File:

PDF, 305 KB

english, 1992

46

A new iridoid, verbascoside and derivatives with inhibitory activity against Taq DNA polymerase

Garro, Hugo A., García, Celina, Martín, Victor S., Tonn, Carlos E., Pungitore, Carlos R.

Journal:

Bioorganic & Medicinal Chemistry Letters

Year:

2015

Language:

english

File:

PDF, 675 KB

english, 2015

47

The controlled growth of GaN microrods on Si(111) substrates by MOCVD

Foltynski, Bartosz, Garro, Nuria, Vallo, Martin, Finken, Matthias, Giesen, Christoph, Kalisch, Holger, Vescan, Andrei, Cantarero, Andrés, Heuken, Michael

Journal:

Journal of Crystal Growth

Year:

2015

Language:

english

File:

PDF, 1.01 MB

english, 2015

48

[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Interface States in Hf-Based Stacks and their Impact on the Reliability of these Alternative Oxides

Garros, Xavier, Reimbold, Gilles, Martin, Francois, Louveau, Olivier

Year:

2006

Language:

english

File:

PDF, 385 KB

english, 2006

49

[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Universal Correlation Between Mobility and NBTI on Advanced High-k/Metal Gate Stacks

Reimbold, Gilles, Garros, Xavier, Casse, Mikael, Rafik, Mustapha, Leroux, Charles, Ribes, Guillaume, Martin, François

Year:

2008

Language:

english

File:

PDF, 697 KB

english, 2008

50

Non-resonant Raman spectroscopy of individual ZnO nanowires via Au nanorod surface plasmons

Pescaglini, Andrea, Secco, Eleonora, Martin, Alfonso, Cammi, Davide, Ronning, Carsten, Cantarero, Andrés, Garro, Nuria, Iacopino, Daniela

Journal:

Journal of Materials Chemistry C

Year:

2016

Language:

english

File:

PDF, 2.11 MB

english, 2016